Liyang Lai

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Wilsonville, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Test access architecture for stacked memory and logic dies
- Patent number 9,689,918
- Issue date Jun 27, 2017
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture for characterizing interconnects in stacked designs
- Patent number 9,335,376
- Issue date May 10, 2016
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional scan architecture
- Patent number 9,222,978
- Issue date Dec 29, 2015
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Detection and diagnosis of scan cell internal defects
- Patent number 9,086,459
- Issue date Jul 21, 2015
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis-aware scan chain stitching
- Patent number 9,015,543
- Issue date Apr 21, 2015
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Compound hold-time fault diagnosis
- Patent number 8,862,956
- Issue date Oct 14, 2014
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test of integrated circuits using selectable weightin...
- Patent number 7,840,865
- Issue date Nov 23, 2010
- Mentor Graphics Corporation
- Liyang Lai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test Architecture for Characterizing Interconnects in Stacked Designs
- Publication number 20140237310
- Publication date Aug 21, 2014
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
Diagnosis-Aware Scan Chain Stitching
- Publication number 20130166976
- Publication date Jun 27, 2013
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Application
Two-Dimensional Scan Architecture
- Publication number 20120233512
- Publication date Sep 13, 2012
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Application
Compound Hold-Time Fault Diagnosis
- Publication number 20120210184
- Publication date Aug 16, 2012
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detection And Diagnosis Of Scan Cell Internal Defects
- Publication number 20110191643
- Publication date Aug 4, 2011
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Application
Built-in self-test of integrated circuits using selectable weightin...
- Publication number 20080235544
- Publication date Sep 25, 2008
- Mentor Graphics Corporation
- Liyang Lai
- G01 - MEASURING TESTING