Lloyd C. LITT

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Latham, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Metrology pattern layout and method of use thereof
- Patent number 9,864,831
- Issue date Jan 9, 2018
- GLOBALFOUNDRIES Inc.
- Guoxiang Ning
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology pattern layout and method of use thereof
- Patent number 9,323,882
- Issue date Apr 26, 2016
- GLOBALFOUNDRIES Inc.
- Guoxiang Ning
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTOLITHOGRAPHY SYSTEM AND METHOD USING A RETICLE WITH MULTIPLE DI...
- Publication number 20190278166
- Publication date Sep 12, 2019
- GLOBALFOUNDRIES INC.
- Lei Sun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY PATTERN LAYOUT AND METHOD OF USE THEREOF
- Publication number 20150278426
- Publication date Oct 1, 2015
- GLOBALFOUNDRIES INC.
- Guoxiang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus, System, and Method for Nanoimprint Template with a Backs...
- Publication number 20110272838
- Publication date Nov 10, 2011
- Matt Malloy
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL