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Lloyd J. Lacomb JR.
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Santa Clara, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Focused beam spectroscopic ellipsometry method and system
Patent number
6,734,967
Issue date
May 11, 2004
KLA-Tencor Technologies Corporation
Timothy R. Piwonka-Corle
G01 - MEASURING TESTING
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Patent Grant
Focused beam spectroscopic ellipsometry method and system
Patent number
5,910,842
Issue date
Jun 8, 1999
KLA-Tencor Corporation
Timothy R. Piwonka-Corle
G01 - MEASURING TESTING
Information
Patent Grant
Focused beam spectroscopic ellipsometry method and system
Patent number
5,608,526
Issue date
Mar 4, 1997
Tencor Instruments
Timothy R. Piwonka-Corle
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Focused beam spectroscopic ellipsometry method and system
Publication number
20050105090
Publication date
May 19, 2005
Timothy R. Piwonka-Corle
G01 - MEASURING TESTING
Information
Patent Application
Focused beam spectroscopic ellipsometry method and system
Publication number
20040100632
Publication date
May 27, 2004
Timothy R. Piwonka-Corle
G01 - MEASURING TESTING