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Logan I. Friedman
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Stamford, CT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Low-latency deserializer having fine granularity and defective-lane...
Patent number
11,907,074
Issue date
Feb 20, 2024
International Business Machines Corporation
Patrick James Meaney
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Low-latency, high-availability and high-speed SerDes interface havi...
Patent number
11,646,861
Issue date
May 9, 2023
International Business Machines Corporation
Patrick James Meaney
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Register access in a distributed memory buffer system
Patent number
10,642,535
Issue date
May 5, 2020
International Business Machines Corporation
Steven R. Carlough
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
JTAG support over a broadcast bus in a distributed memory buffer sy...
Patent number
10,393,805
Issue date
Aug 27, 2019
International Business Machines Corporation
Logan I. Friedman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LOW-LATENCY DESERIALIZER HAVING FINE GRANULARITY AND DEFECTIVE-LANE...
Publication number
20230115533
Publication date
Apr 13, 2023
International Business Machines Corporation
Patrick James Meaney
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LOW-LATENCY, HIGH-AVAILABILITY AND HIGH-SPEED SERDES INTERFACE HAVI...
Publication number
20230098514
Publication date
Mar 30, 2023
International Business Machines Corporation
Patrick James Meaney
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Register Access in a Distributed Memory Buffer System
Publication number
20190227741
Publication date
Jul 25, 2019
International Business Machines Corporation
Steven R. Carlough
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
JTAG SUPPORT OVER A BROADCAST BUS IN A DISTRIBUTED MEMORY BUFFER SY...
Publication number
20190170819
Publication date
Jun 6, 2019
International Business Machines Corporation
Logan I. Friedman
G01 - MEASURING TESTING