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Loic Sanchez
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La Murette, FR
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last 30 patents
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Patent Grant
Method for revealing emergent dislocations in a germanium-base crys...
Patent number
8,003,550
Issue date
Aug 23, 2011
Commissariat a l'Energie Atomique
Loic Sanchez
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for monitoring a heat treatment of a microtechnol...
Patent number
7,846,749
Issue date
Dec 7, 2010
Commissariat a l'Energie Atomique
Loïc Sanchez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating a semiconductor on insulator wafer
Patent number
7,776,716
Issue date
Aug 17, 2010
S.O.I. Tec Silicon on Insulator Technologies
Chrystel Deguet
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Method for revealing emergent dislocations in a germanium-base crys...
Publication number
20100184303
Publication date
Jul 22, 2010
COMMISSARIAT A L'ENERGIE ATOMIQUE
Loic Sanchez
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MONITORING A HEAT TREATMENT OF A MICROTECHNOL...
Publication number
20100015733
Publication date
Jan 21, 2010
Loïc Sanchez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR FABRICATING A SEMICONDUCTOR ON INSULATOR WAFER
Publication number
20070284660
Publication date
Dec 13, 2007
Chrystel Deguet
H01 - BASIC ELECTRIC ELEMENTS