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Lois E. Yong
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device having a bond pad and method therefor
Patent number
7,271,013
Issue date
Sep 18, 2007
FREESCALE SEMICONDUCTOR, INC.
Lois E. Yong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit with test pad structure and method of testing
Patent number
6,937,047
Issue date
Aug 30, 2005
FREESCALE SEMICONDUCTOR, INC.
Tu-Anh Tran
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device having a bond pad and method therefor
Patent number
6,844,631
Issue date
Jan 18, 2005
FREESCALE SEMICONDUCTOR, INC.
Lois E. Yong
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Integrated circuit with test pad structure and method of testing
Publication number
20050030055
Publication date
Feb 10, 2005
Tu-Anh Tran
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device having a bond pad and method therefor
Publication number
20030173667
Publication date
Sep 18, 2003
Lois E. Yong
H01 - BASIC ELECTRIC ELEMENTS