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Hsin-Chu Hsien, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Schottky device and process of making the same comprising a geometr...
Patent number
8,125,008
Issue date
Feb 28, 2012
System General Corporation
Chiu-Chih Chiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit with high voltage junction structure
Patent number
7,732,890
Issue date
Jun 8, 2010
System General Corp.
Chiu-Chih Chiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Voltage-clipping device with high breakdown voltage
Patent number
7,655,990
Issue date
Feb 2, 2010
System General Corp.
Chiu-Chih Chiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of defect inspection
Patent number
7,382,451
Issue date
Jun 3, 2008
Powerchip Semiconductor Corp.
Long-Hui Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wafer defect detection methods and systems
Patent number
7,193,698
Issue date
Mar 20, 2007
Powerchip Semiconductor Corp.
Long-Hui Lin
G01 - MEASURING TESTING
Information
Patent Grant
Inspection methods for a semiconductor device
Patent number
7,132,354
Issue date
Nov 7, 2006
Powerchip Semiconductor Corp.
Long-Hui Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of defect review
Patent number
7,071,011
Issue date
Jul 4, 2006
Powerchip Semiconductor Corp.
Long-Hui Lin
G01 - MEASURING TESTING
Information
Patent Grant
Method of building a defect database
Patent number
7,020,536
Issue date
Mar 28, 2006
Powerchip Semiconductor Corp.
Long-Hui Lin
G01 - MEASURING TESTING
Information
Patent Grant
Process tool throughput monitoring system and method
Patent number
6,907,306
Issue date
Jun 14, 2005
Macronix International, Co., Ltd.
Chiung-Fang Hsieh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Throughput analysis system and method
Patent number
6,873,878
Issue date
Mar 29, 2005
Macronix International Co., Ltd.
Kuei-Yi Liu
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Method of piping defect detection
Patent number
6,825,119
Issue date
Nov 30, 2004
Powerchip Semiconductor Corp.
Long-Hui Lin
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatically controlling defect -specification in a sem...
Patent number
6,807,454
Issue date
Oct 19, 2004
Powerchip Semiconductor Corp.
Sheng-Jen Wang
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Method and apparatus for regulating exhaust pressure in evacuation...
Patent number
6,711,956
Issue date
Mar 30, 2004
Macronix International Co., Ltd.
Yu-An Lin
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Schottky device and process of making the same
Publication number
20080116539
Publication date
May 22, 2008
System General Corporation
Chiu-Chih Chiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED CIRCUIT WITH HIGH VOLTAGE JUNCTION STRUCTURE
Publication number
20080001195
Publication date
Jan 3, 2008
SYSTEM GENERAL CORP.
Chiu-Chih Chiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VOLTAGE-CLIPPING DEVICE WITH HIGH BREAKDOWN VOLTAGE
Publication number
20070290276
Publication date
Dec 20, 2007
SYSTEM GENERAL CORP.
Chiu-Chih Chiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAFER DEFECT DETECTION METHODS AND SYSTEMS
Publication number
20070013900
Publication date
Jan 18, 2007
Powerchip Seminconductor Corp.
Long-Hui Lin
G01 - MEASURING TESTING
Information
Patent Application
Inspection methods for a semiconductor device
Publication number
20060134812
Publication date
Jun 22, 2006
Powerchip Seminconductor Corp.
Long-Hui Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF DEFECT INSPECTION
Publication number
20050248756
Publication date
Nov 10, 2005
Long-Hui Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF BUILDING A DEFECT DATABASE
Publication number
20050177264
Publication date
Aug 11, 2005
Long-Hui Lin
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DEFECT REVIEW
Publication number
20050159909
Publication date
Jul 21, 2005
Long-Hui Lin
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DEFECT CONTROL
Publication number
20050080572
Publication date
Apr 14, 2005
Long-Hui Lin
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD OF DEFECT ROOT CAUSE ANALYSIS
Publication number
20050049836
Publication date
Mar 3, 2005
Long-Hui Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process tool throughput monitoring system and method
Publication number
20040243268
Publication date
Dec 2, 2004
Chiung-Fang Hsieh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR AUTOMATICALLY CONTROLLING DEFECT -SPECIFICATION IN A SEM...
Publication number
20030212469
Publication date
Nov 13, 2003
Sheng-Jen Wang
G05 - CONTROLLING REGULATING
Information
Patent Application
Throughput analysis system and method
Publication number
20030187535
Publication date
Oct 2, 2003
Kuei-Yi Liu
G05 - CONTROLLING REGULATING
Information
Patent Application
Method and apparatus for regulating exhaust pressure in evacuation...
Publication number
20030079550
Publication date
May 1, 2003
MACRONIX INTERNATIONAL CO., LTD
Yu-An Lin
G05 - CONTROLLING REGULATING