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Long-Sheng Liao
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Jungli City, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Buffer layer for promoting electron mobility and thin film transist...
Patent number
8,178,882
Issue date
May 15, 2012
AU Optronics Corp.
Long-Sheng Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Buffer layer for promoting electron mobility and thin film transist...
Patent number
7,608,475
Issue date
Oct 27, 2009
AU Optronics Corp.
Long-Sheng Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thin film transistor with buffer layer for promoting electron mobility
Patent number
6,984,848
Issue date
Jan 10, 2006
AU Optronics Corp.
Long-Sheng Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of inspecting grain size of a polysilicon film
Patent number
6,922,243
Issue date
Jul 26, 2005
AU Optronics Corp.
Kun-Chih Lin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
BUFFER LAYER FOR PROMOTING ELECTRON MOBILITY AND THIN FILM TRANSIST...
Publication number
20090321744
Publication date
Dec 31, 2009
AU Optronics Corp.
Long-Sheng Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM OF BEAM ENERGY CONTROL
Publication number
20070287203
Publication date
Dec 13, 2007
AU Optronics Corp.
Long-Sheng Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Buffer layer for promoting electron mobility and thin film transist...
Publication number
20060038173
Publication date
Feb 23, 2006
AU Optronics Corp.
Long-Sheng Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system of beam energy control
Publication number
20040241889
Publication date
Dec 2, 2004
AU Optronics Corp.
Long-Sheng Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Buffer layer for promoting electron mobility and thin film transist...
Publication number
20040140468
Publication date
Jul 22, 2004
AU Optronics Corp.
Long-Sheng Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for inspecting crystal quality of a polysilico...
Publication number
20040115337
Publication date
Jun 17, 2004
AU Optronics Corp.
Yi-Chang Tsao
G01 - MEASURING TESTING
Information
Patent Application
Process for forming polysilicon layer and fabrication of thin film...
Publication number
20040106240
Publication date
Jun 3, 2004
AU Optronics Corp.
Chia-Tien Peng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of inspecting grain size of a polysilicon film
Publication number
20040075835
Publication date
Apr 22, 2004
AU Optronics Corp.
Kun-Chih Lin
G01 - MEASURING TESTING