Long Vu

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Round Rock, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray microanalyzer for thin films
- Patent number 6,381,303
- Issue date Apr 30, 2002
- Jordan Valley Applied Radiation Ltd.
- Long Vu
- G01 - MEASURING TESTING
Information Patent Grant
Detection of voids in semiconductor wafer processing
- Patent number 6,351,516
- Issue date Feb 26, 2002
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING