Membership
Tour
Register
Log in
Longcheng Que
Follow
Person
Chengdu, CN
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method and system of two-point correction based on temperature subs...
Patent number
11,828,655
Issue date
Nov 28, 2023
University of Electronic Science and Technology of China
Yun Zhou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Exponential model based uncooled infrared focal plane array readout...
Patent number
10,996,107
Issue date
May 4, 2021
University of Electronic Science and Technology of China
Longcheng Que
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Infrared focal plane readout integrated circuit
Patent number
10,036,669
Issue date
Jul 31, 2018
University of Electronic Science and Technology of China
Jian Lv
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Readout circuit for uncooled infrared focal plane array
Patent number
9,163,996
Issue date
Oct 20, 2015
University of Electronic Science and Technology China
Jian Lv
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM OF TWO-POINT CORRECTION BASED ON TEMPERATURE SUBS...
Publication number
20220187131
Publication date
Jun 16, 2022
University of Electronic Science and Technology of China
Yun ZHOU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for Processing Infrared Image of Power Device Based on Measu...
Publication number
20220058789
Publication date
Feb 24, 2022
University of Electronic Science and Technology of China
Yun ZHOU
G01 - MEASURING TESTING
Information
Patent Application
Exponential Model Based Uncooled Infrared Focal Plane Array Readout...
Publication number
20210048340
Publication date
Feb 18, 2021
University of Electronic Science and Technology of China
Longcheng Que
G01 - MEASURING TESTING
Information
Patent Application
Readout circuit for uncooled infrared focal plane array
Publication number
20150192472
Publication date
Jul 9, 2015
University of Electronic Science and Technology of China
Jian Lv
G01 - MEASURING TESTING