Longju Liu

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Stress test for grown bad blocks
- Patent number 11,967,388
- Issue date Apr 23, 2024
- Western Digital Technologies, Inc.
- Sarath Puthenthermadam
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHODS FOR SMART VERIFY WITH ADAPTIVE VOLTAGE OFFSET
- Publication number 20240203512
- Publication date Jun 20, 2024
- SANDISK TECHNOLOGIES LLC
- Longju Liu
- G11 - INFORMATION STORAGE
Information Patent Application
STRESS TEST FOR GROWN BAD BLOCKS
- Publication number 20240055063
- Publication date Feb 15, 2024
- Western Digital Technologies, Inc.
- Sarath Puthenthermadam
- G11 - INFORMATION STORAGE