Longmin Chen

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Dual-frequency grating interferometer displacement measurement system
- Patent number 9,885,556
- Issue date Feb 6, 2018
- Tsinghua University
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne grating interferometer displacement measurement system
- Patent number 9,879,979
- Issue date Jan 30, 2018
- Tsinghua University
- Ming Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Planar motor rotor displacement measuring device and its measuring...
- Patent number 9,766,054
- Issue date Sep 19, 2017
- Shanghai Micro Electronics Equipment Co., Ltd.
- Jinchun Hu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
HETERODYNE GRATING INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM
- Publication number 20150338205
- Publication date Nov 26, 2015
- TSINGHUA UNIVERSITY
- Ming Zhang
- G01 - MEASURING TESTING
Information Patent Application
DUAL-FREQUENCY GRATING INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM
- Publication number 20150268031
- Publication date Sep 24, 2015
- TSINGHUA UNIVERSITY
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Application
PLANAR MOTOR ROTOR DISPLACEMENT MEASURING DEVICE AND ITS MEASURING...
- Publication number 20150012242
- Publication date Jan 8, 2015
- SHANGHAI MICRO ELECTRONICS EQUIPMENT Co., LTD.
- Jinchun Hu
- G01 - MEASURING TESTING