Lonnie L. Lambert

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for improved memory scan testability
- Patent number 7,315,971
- Issue date Jan 1, 2008
- Texas Instruments Incorporated
- William E. Grose
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Systems and methods for improved memory scan testability
- Publication number 20070168776
- Publication date Jul 19, 2007
- TEXAS INSTRUMENTS INCORPORATED
- William E. Grose
- G11 - INFORMATION STORAGE