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Loren L. Hahn
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Cedar Creek, TX, US
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last 30 patents
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Patent Grant
Method of accessing semiconductor circuits from the backside using...
Patent number
7,867,910
Issue date
Jan 11, 2011
International Business Machines Corporation
Carmelo F. Scrudato
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Non-destructive, below-surface defect rendering using image intensi...
Patent number
7,835,564
Issue date
Nov 16, 2010
International Business Machines Corporation
Delia R. Bearup
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD OF ACCESSING SEMICONDUCTOR CIRCUITS FROM THE BACKSIDE USING...
Publication number
20090302431
Publication date
Dec 10, 2009
International Business Machines Corporation
Carmelo F. Scrudato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-DESTRUCTIVE, BELOW-SURFACE DEFECT RENDERING USING IMAGE INTENSI...
Publication number
20080270081
Publication date
Oct 30, 2008
International Business Machines Corporation
Delia R. Bearup
G01 - MEASURING TESTING