Loren W. Linholm

Person

Ijamsville, MD, US

People

Patents Grantslast 30 patents

Information Patent Grant
Overlay target and measurement procedure to enable self-correction...
- Patent number 5,923,041
- Issue date Jul 13, 1999
- Michael William Cresswell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Monocrystalline test and reference structures, and use for calibrat...
- Patent number 5,920,067
- Issue date Jul 6, 1999
- The United States of America as represented by the Secretary of Commerce
- Michael W. Cresswell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electrical test structure and method for measuring the relative loc...
- Patent number 5,857,258
- Issue date Jan 12, 1999
- The United States of America as represented by the Secretary of Commerce
- William B. Penzes
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Monocrystalline test structures, and use for calibrating instruments
- Patent number 5,684,301
- Issue date Nov 4, 1997
- The United States of America as represented by the Secretary of Commerce
- Michael W. Cresswell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and reference standards for measuring overlay in multilayer...
- Patent number 5,617,340
- Issue date Apr 1, 1997
- The United States of America as represented by the Secretary of Commerce
- Michael W. Cresswell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electrical test structure and method for measuring the relative loc...
- Patent number 5,602,492
- Issue date Feb 11, 1997
- The United States of America as represented by the Secretary of Commerce
- Michael W. Cresswell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electrical test structure and method for measuring the relative loc...
- Patent number 5,383,136
- Issue date Jan 17, 1995
- The United States of America as represented by the Secretary of Commerce
- Michael Cresswell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of and articles for accurately determining relative position...
- Patent number 5,373,232
- Issue date Dec 13, 1994
- The United States of America as represented by the Secretary of Commerce
- Michael W. Cresswell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Linewidth micro-bridge test structure
- Patent number 5,247,262
- Issue date Sep 21, 1993
- The United States of America as represented by the Secretary of Commerce
- Michael Cresswell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for sampling the sizes, geometrical distribution, and freque...
- Patent number 5,218,211
- Issue date Jun 8, 1993
- The United States of America as represented by the Secretary of Commerce
- Michael W. Cresswell
- G01 - MEASURING TESTING

Loren W. Linholm

Person

Patents Grantslast 30 patents

Overlay target and measurement procedure to enable self-correction...

Monocrystalline test and reference structures, and use for calibrat...

Electrical test structure and method for measuring the relative loc...

Monocrystalline test structures, and use for calibrating instruments

Method and reference standards for measuring overlay in multilayer...

Electrical test structure and method for measuring the relative loc...

Electrical test structure and method for measuring the relative loc...

Method of and articles for accurately determining relative position...

Linewidth micro-bridge test structure

System for sampling the sizes, geometrical distribution, and freque...