Lorenz Lechner

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Ulm, DE

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Patents Grantslast 30 patents

Information Patent Grant
Particle beam device comprising an electrode unit
- Patent number 9,312,093
- Issue date Apr 12, 2016
- Carl Zeiss Microscopy GmbH
- Joerg Fober
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a particle beam microscope and a particle beam...
- Patent number 9,140,656
- Issue date Sep 22, 2015
- Carl Zeiss Microscopy GmbH
- Lorenz Lechner
- G01 - MEASURING TESTING
Information Patent Grant
TEM-lamella, process for its manufacture, and apparatus for executi...
- Patent number 9,103,753
- Issue date Aug 11, 2015
- Carl Zeiss Microscopy GmbH
- Lorenz Lechner
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam system and method of processing a TEM-sample
- Patent number 8,835,843
- Issue date Sep 16, 2014
- Carl Zeiss Microscopy GmbH
- Lorenz Lechner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING A TEM-LAMELLA AND ASSEMBLY HAVING A TEM-LA...
- Publication number 20150028225
- Publication date Jan 29, 2015
- CARL ZEISS MICROSCOPY GMBH
- Lorenz Lechner
- B32 - LAYERED PRODUCTS
Information Patent Application
METHOD OF OPERATING A PARTICLE BEAM MICROSCOPE AND A PARTICLE BEAM...
- Publication number 20150014528
- Publication date Jan 15, 2015
- CARL ZEISS MICROSCOPY GMBH
- Lorenz Lechner
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD OF PROCESSING A TEM-SAMPLE
- Publication number 20140110577
- Publication date Apr 24, 2014
- CARL ZEISS MICROSCOPY GMBH
- Lorenz Lechner
- G01 - MEASURING TESTING
Information Patent Application
TEM-Lamella, Process for its Manufacture, and Apparatus for Executi...
- Publication number 20120189813
- Publication date Jul 26, 2012
- CARL ZEISS NTS GMBH
- Lorenz Lechner
- G01 - MEASURING TESTING