Lorraine Ellen YOUNG

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Enhanced defect detection in electron beam inspection and review
- Patent number 9,449,788
- Issue date Sep 20, 2016
- KLA-Tencor Corporation
- Gary G. Fan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ENHANCED DEFECT DETECTION IN ELECTRON BEAM INSPECTION AND REVIEW
- Publication number 20150090877
- Publication date Apr 2, 2015
- KLA-Tencor Corporation
- Gary G. FAN
- G01 - MEASURING TESTING