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Lothar F. Bieg
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Albuquerque, NM, US
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last 30 patents
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Patent Grant
Highly accurate articulated coordinate measuring machine
Patent number
6,668,466
Issue date
Dec 30, 2003
Sandia Corporation
Lothar F. Bieg
G01 - MEASURING TESTING
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Patent Grant
Bi-directional planar slide mechanism
Patent number
6,640,452
Issue date
Nov 4, 2003
Sandia Corporation
Lothar F. Bieg
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Position feedback control system
Patent number
6,519,860
Issue date
Feb 18, 2003
Sandia Corporation
Lothar F. Bieg
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Grant
Multi-axis planar slide system
Patent number
6,463,664
Issue date
Oct 15, 2002
Sandia Corporation
Lothar F. Bieg
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Precision displacement reference system
Patent number
6,028,304
Issue date
Feb 22, 2000
Sandia Corporation
Lothar F. Bieg
G01 - MEASURING TESTING