Lothar Kress

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Thermal interface material handling for thermal control of an elect...
- Patent number 9,377,486
- Issue date Jun 28, 2016
- Intel Corporation
- David Won-jun Song
- G01 - MEASURING TESTING
Information Patent Grant
Wire probe assembly and forming process for die testing
- Patent number 9,069,014
- Issue date Jun 30, 2015
- Intel Corporation
- Todd P. Albertson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THERMAL INTERFACE MATERIAL HANDLING FOR THERMAL CONTROL OF AN ELECT...
- Publication number 20150276798
- Publication date Oct 1, 2015
- David Won-jun Song
- G01 - MEASURING TESTING
Information Patent Application
Wire Probe Assembly and Forming Process for Die Testing
- Publication number 20140002124
- Publication date Jan 2, 2014
- Todd P. Albertson
- G01 - MEASURING TESTING
Information Patent Application
Accurate alignment of semiconductor devices and sockets
- Publication number 20080238460
- Publication date Oct 2, 2008
- Lothar Kress
- G01 - MEASURING TESTING