91054 Erlangen, DE
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Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
István Endre Lukács
G01 - MEASURING TESTING
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Infineon Technologies AG
Claus Schneider
B08 - CLEANING
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Semiconductor 300 GmbH & Co. KG
Norbert Benesch
G01 - MEASURING TESTING
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Infineon Technologies AG
Olaf Storbeck
G01 - MEASURING TESTING
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raunhofer-Gesellschaft zur Foederung der Angewandten Forschung E.V.
Jürgen Ziegler
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Infineon Technologies AG
Norbert Benesch
G01 - MEASURING TESTING
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Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
Richard Oechsner
G07 - CHECKING-DEVICES
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Lothar Pfitzner
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Fraunhofer Gesellschaft zur Forderung der angewandten Forschung e.V.
Istvan Endre Lukacs
G01 - MEASURING TESTING
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Olaf Storbeck
G01 - MEASURING TESTING
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Patent Application
Claus Schneider
G01 - MEASURING TESTING
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Patent Application
Norbert Benesch
G01 - MEASURING TESTING
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Patent Application
Jurgen Ziegler
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Application
Norbert Benesch
G01 - MEASURING TESTING
