Louis Bernard Bushard

Person

Rochester, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
LSSD compatibility for GSD unified global clock buffers
- Patent number 8,117,579
- Issue date Feb 14, 2012
- International Business Machines Corporation
- James Douglas Warnock
- G01 - MEASURING TESTING
Information Patent Grant
Implementing enhanced LBIST testing of paths including arrays
- Patent number 7,844,869
- Issue date Nov 30, 2010
- International Business Machines Corporation
- Louis Bernard Bushard
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a ring of non-scan latches with lo...
- Patent number 7,797,600
- Issue date Sep 14, 2010
- International Business Machines Corporation
- Louis B. Bushard
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for implementing eFuse sense amplifier testing without bl...
- Patent number 7,733,722
- Issue date Jun 8, 2010
- International Business Machines Corporation
- Anthony Gus Aipperspach
- G11 - INFORMATION STORAGE
Information Patent Grant
Implementing Efuse sense amplifier testing without blowing the Efuse
- Patent number 7,689,950
- Issue date Mar 30, 2010
- International Business Machines Corporation
- Anthony Gus Aipperspach
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and apparatus for testing a memory
- Patent number 7,562,267
- Issue date Jul 14, 2009
- International Business Machines Corporation
- Anthony G. Aipperspach
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for implementing eFuse sense amplifier testing without blowi...
- Patent number 7,489,572
- Issue date Feb 10, 2009
- International Business Machines Corporation
- Anthony Gus Aipperspach
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing a ring of non-scan latches with lo...
- Patent number 7,406,640
- Issue date Jul 29, 2008
- International Business Machines Corporation
- Louis Bernard Bushard
- G01 - MEASURING TESTING
Information Patent Grant
Memory array manufacturing defect detection system and method
- Patent number 7,318,182
- Issue date Jan 8, 2008
- International Business Machines Corporation
- Louis Bernard Bushard
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit apparatus and method for testing integrated circuits using...
- Patent number 7,080,298
- Issue date Jul 18, 2006
- Toshiba America Electronic Components
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for circuit testing
- Patent number 7,055,077
- Issue date May 30, 2006
- Kabushiki Kaisha Toshiba
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Grant
Signal pin tester for AC defects in integrated circuits
- Patent number 6,909,274
- Issue date Jun 21, 2005
- International Business Machines Corporation
- Frank W. Angelotti
- G01 - MEASURING TESTING
Information Patent Grant
Signal pin tester for AC defects in integrated circuits
- Patent number 6,590,382
- Issue date Jul 8, 2003
- International Business Machines Corp.
- Frank W. Angelotti
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LSSD compatibility for GSD unified global clock buffers
- Publication number 20090199036
- Publication date Aug 6, 2009
- James D. Warnock
- G01 - MEASURING TESTING
Information Patent Application
Method and circuit for implementing enhanced LBIST testing of paths...
- Publication number 20090183044
- Publication date Jul 16, 2009
- Louis Bernard Bushard
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR IMPLEMENTING EFUSE SENSE AMPLIFIER TESTING WITHOUT BL...
- Publication number 20090175106
- Publication date Jul 9, 2009
- International Business Machines Corporation
- Anthony Gus Aipperspach
- G11 - INFORMATION STORAGE
Information Patent Application
Staggered LBIST Clock Sequence for Noise (di/dt) Amelioration
- Publication number 20090063921
- Publication date Mar 5, 2009
- Anthony Gus Aipperspach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Testing a Ring of Non-Scan Latches with Lo...
- Publication number 20080250290
- Publication date Oct 9, 2008
- International Business Machines Corporation
- Louis Bernard Bushard
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Implementing Efuse Sense Amplifier Testing...
- Publication number 20080170449
- Publication date Jul 17, 2008
- Anthony Gus Aipperspach
- G11 - INFORMATION STORAGE
Information Patent Application
Method and Apparatus for Implementing Efuse Sense Amplifier Testing...
- Publication number 20080169843
- Publication date Jul 17, 2008
- International Business Machines Corporation
- Anthony Gus Aipperspach
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING A RING OF NON-SCAN LATCHES WITH LO...
- Publication number 20070234159
- Publication date Oct 4, 2007
- LOUIS BERNARD BUSHARD
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for LBIST testing using commonly controlled LBI...
- Publication number 20070168809
- Publication date Jul 19, 2007
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a memory
- Publication number 20060156091
- Publication date Jul 13, 2006
- International Business Machines Corporation
- Anthony G. Aipperspach
- G11 - INFORMATION STORAGE
Information Patent Application
Memory array manufacturing defect detection system and method
- Publication number 20060156090
- Publication date Jul 13, 2006
- International Business Machines Corporation
- Louis Bernard Bushard
- G11 - INFORMATION STORAGE
Information Patent Application
Signal pin tester for AC defects in integrated circuits
- Publication number 20050172187
- Publication date Aug 4, 2005
- Frank W. Angelotti
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for circuit testing
- Publication number 20050138509
- Publication date Jun 23, 2005
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Application
Signal pin tester for AC defects in integrated circuits
- Publication number 20040153919
- Publication date Aug 5, 2004
- Frank W. Angelotti
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing integrated circuits using weighted...
- Publication number 20040153916
- Publication date Aug 5, 2004
- Naoki Kiryu
- G01 - MEASURING TESTING
Information Patent Application
Signal pin tester for AC defects in integrated circuits
- Publication number 20020079880
- Publication date Jun 27, 2002
- International Business Machines Corporation
- Frank W. Angelotti
- G01 - MEASURING TESTING

Louis Bernard Bushard

Person

Patents Grantslast 30 patents

LSSD compatibility for GSD unified global clock buffers

Implementing enhanced LBIST testing of paths including arrays

Method and apparatus for testing a ring of non-scan latches with lo...

Apparatus for implementing eFuse sense amplifier testing without bl...

Implementing Efuse sense amplifier testing without blowing the Efuse

Methods and apparatus for testing a memory

Method for implementing eFuse sense amplifier testing without blowi...

Method and apparatus for testing a ring of non-scan latches with lo...

Memory array manufacturing defect detection system and method

Circuit apparatus and method for testing integrated circuits using...

Systems and methods for circuit testing

Signal pin tester for AC defects in integrated circuits

Signal pin tester for AC defects in integrated circuits

Patents Applicationslast 30 patents

LSSD compatibility for GSD unified global clock buffers

Method and circuit for implementing enhanced LBIST testing of paths...

APPARATUS FOR IMPLEMENTING EFUSE SENSE AMPLIFIER TESTING WITHOUT BL...

Staggered LBIST Clock Sequence for Noise (di/dt) Amelioration

Method and Apparatus for Testing a Ring of Non-Scan Latches with Lo...

Method and Apparatus for Implementing Efuse Sense Amplifier Testing...

Method and Apparatus for Implementing Efuse Sense Amplifier Testing...

METHOD AND APPARATUS FOR TESTING A RING OF NON-SCAN LATCHES WITH LO...

Systems and methods for LBIST testing using commonly controlled LBI...

Methods and apparatus for testing a memory

Memory array manufacturing defect detection system and method

Signal pin tester for AC defects in integrated circuits

Systems and methods for circuit testing

Signal pin tester for AC defects in integrated circuits

Apparatus and method for testing integrated circuits using weighted...

Signal pin tester for AC defects in integrated circuits