Louis C. Hellemans

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Pellenburg, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring the electrical potential in a semiconductor el...
- Patent number 6,201,401
- Issue date Mar 13, 2001
- IMEC
- Louis C. Hellemans
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the electrical potential in a semiconductor el...
- Patent number 6,091,248
- Issue date Jul 18, 2000
- IMEC vzw
- Louis C. Hellemans
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the electrical potential in a semiconductor el...
- Patent number 5,723,981
- Issue date Mar 3, 1998
- IMEC vzw
- Louis C. Hellemans
- B82 - NANO-TECHNOLOGY