Louis Nelson Ahlquist

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Annandale, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for testing integrated circuits
- Patent number 6,560,735
- Issue date May 6, 2003
- Agere Systems Inc.
- Louis Nelson Ahlquist
- G01 - MEASURING TESTING
Information Patent Grant
Process for the manufacture of optical integrated circuits
- Patent number 6,225,191
- Issue date May 1, 2001
- Lucent Technologies Inc.
- Louis Nelson Ahlquist
- G02 - OPTICS
Information Patent Grant
Manufacture of flip-chip device
- Patent number 6,015,652
- Issue date Jan 18, 2000
- Lucent Technologies Inc.
- Louis Nelson Ahlquist
- H01 - BASIC ELECTRIC ELEMENTS