Louis V. Medina

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Hopewell Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer probing system including pressure sensing and c...
- Patent number 9,702,930
- Issue date Jul 11, 2017
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensing and control for semiconductor wafer probing
- Patent number 9,354,252
- Issue date May 31, 2016
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensing and control for semiconductor wafer probing
- Patent number 8,963,567
- Issue date Feb 24, 2015
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Real time system for monitoring the commonality, sensitivity, and r...
- Patent number 7,856,332
- Issue date Dec 21, 2010
- International Business Machines Corporation
- Muthukumarasamy Karthikeyan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
- Publication number 20160216321
- Publication date Jul 28, 2016
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
- Publication number 20150145544
- Publication date May 28, 2015
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
- Publication number 20130106455
- Publication date May 2, 2013
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Application
REAL TIME SYSTEM FOR MONITORING THE COMMONALITY, SENSITIVITY, AND R...
- Publication number 20090143999
- Publication date Jun 4, 2009
- International Business Machines Corporation
- Muthukumarasamy Karthikeyan
- G01 - MEASURING TESTING