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Louis Vintro
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Menlo Park, CA, US
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last 30 patents
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Patent Grant
Computer-implemented methods, computer-readable media, and systems...
Patent number
8,494,802
Issue date
Jul 23, 2013
KLA-Tencor Corp.
Haiguang Chen
G01 - MEASURING TESTING
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Patent Grant
Computer-implemented methods for inspecting and/or classifying a wafer
Patent number
8,269,960
Issue date
Sep 18, 2012
KLA-Tencor Corp.
Juergen Reich
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
COMPUTER-IMPLEMENTED METHODS, COMPUTER-READABLE MEDIA, AND SYSTEMS...
Publication number
20110196639
Publication date
Aug 11, 2011
Kla-Tencor Corporation
Haiguang Chen
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
COMPUTER-IMPLEMENTED METHODS FOR INSPECTING AND/OR CLASSIFYING A WAFER
Publication number
20100060888
Publication date
Mar 11, 2010
KLA-Tencor Corporation
Juergen Reich
G01 - MEASURING TESTING