Luai Nasser

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Union City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System, method and apparatus for in-situ substrate inspection
- Patent number 7,542,134
- Issue date Jun 2, 2009
- Lam Research Corporation
- Aleksander Owczarz
- G01 - MEASURING TESTING
Information Patent Grant
System, method and apparatus for in-situ substrate inspection
- Patent number 7,397,555
- Issue date Jul 8, 2008
- Lam Research Corporation
- Aleksander Owczarz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM, METHOD AND APPARATUS FOR IN-SITU SUBSTRATE INSPECTION
- Publication number 20080273195
- Publication date Nov 6, 2008
- Aleksander Owczarz
- G01 - MEASURING TESTING
Information Patent Application
System, method and apparatus for in-situ substrate inspection
- Publication number 20060139450
- Publication date Jun 29, 2006
- Lam Research Corp.
- Aleksander Owczarz
- G01 - MEASURING TESTING