Lubomir Tuma

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle microscope for examining a specimen, and method of...
- Patent number 12,080,512
- Issue date Sep 3, 2024
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Counter pole with permanent magnets
- Patent number 11,417,493
- Issue date Aug 16, 2022
- FEI Company
- Lubomír Tůma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contactless temperature measurement in a charged particle microscope
- Patent number 10,134,563
- Issue date Nov 20, 2018
- FEI Company
- Jacob Simon Faber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen holder for a charged particle microscope
- Patent number 9,741,527
- Issue date Aug 22, 2017
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle microscope with astigmatism compensation and energ...
- Patent number 9,741,525
- Issue date Aug 22, 2017
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using a compound particle-optical lens
- Patent number 9,490,100
- Issue date Nov 8, 2016
- FEI Company
- Petr Sytar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-column detector for particle-optical column
- Patent number 9,362,086
- Issue date Jun 7, 2016
- FEI Company
- Lubomír Tůma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for imaging a sample in a charged particle apparatus
- Patent number 9,053,899
- Issue date Jun 9, 2015
- FEI COMPANY
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Configurable charged-particle apparatus
- Patent number 8,829,470
- Issue date Sep 9, 2014
- FEI Company
- Lubomir Tuma
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE MICROSCOPE FOR EXAMINING A SPECIMEN, AND METHOD OF...
- Publication number 20240395496
- Publication date Nov 28, 2024
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COUNTER POLE WITH PERMANENT MAGNETS
- Publication number 20220199354
- Publication date Jun 23, 2022
- FEI Company
- Lubomír Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE FOR EXAMINING A SPECIMEN, AND METHOD OF...
- Publication number 20200152416
- Publication date May 14, 2020
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...
- Publication number 20180061613
- Publication date Mar 1, 2018
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH ASTIGMATISM COMPENSATION AND ENERG...
- Publication number 20170221673
- Publication date Aug 3, 2017
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN HOLDER FOR A CHARGED PARTICLE MICROSCOPE
- Publication number 20160181059
- Publication date Jun 23, 2016
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20160133436
- Publication date May 12, 2016
- FEI Company
- Jacob Simon Faber
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMAGING A SAMPLE IN A CHARGED PARTICLE APPARATUS
- Publication number 20140361165
- Publication date Dec 11, 2014
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Configurable Charged-Particle Apparatus
- Publication number 20140110597
- Publication date Apr 24, 2014
- FEI Company
- Lubomir Tuma
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN
- Publication number 20140097341
- Publication date Apr 10, 2014
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Using a Compound Particle-Optical Lens
- Publication number 20140070098
- Publication date Mar 13, 2014
- FEI Company
- Petr Sytar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN
- Publication number 20120273677
- Publication date Nov 1, 2012
- FEI Company
- Lubomir Tuma
- H01 - BASIC ELECTRIC ELEMENTS

Lubomir Tuma

Person

Patents Grantslast 30 patents

Charged particle microscope for examining a specimen, and method of...

Counter pole with permanent magnets

Contactless temperature measurement in a charged particle microscope

Specimen holder for a charged particle microscope

Charged-particle microscope with astigmatism compensation and energ...

Method of using a compound particle-optical lens

In-column detector for particle-optical column

Method for imaging a sample in a charged particle apparatus

Configurable charged-particle apparatus

Patents Applicationslast 30 patents

CHARGED PARTICLE MICROSCOPE FOR EXAMINING A SPECIMEN, AND METHOD OF...

COUNTER POLE WITH PERMANENT MAGNETS

CHARGED PARTICLE MICROSCOPE FOR EXAMINING A SPECIMEN, AND METHOD OF...

CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...

CHARGED-PARTICLE MICROSCOPE WITH ASTIGMATISM COMPENSATION AND ENERG...

SPECIMEN HOLDER FOR A CHARGED PARTICLE MICROSCOPE

CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE

METHOD FOR IMAGING A SAMPLE IN A CHARGED PARTICLE APPARATUS

Configurable Charged-Particle Apparatus

IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN

Method of Using a Compound Particle-Optical Lens

IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN