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Luc Richard Kruger
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Eindhoven, NL
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last 30 patents
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Patent Grant
All in one plan scan imaging for optimization of acquisition parame...
Patent number
7,715,899
Issue date
May 11, 2010
Koninklijke Philips Electronics N.V.
Paul Royston Harvey
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
All in one plan scan imaging for optimization of acquisition parame...
Publication number
20070276220
Publication date
Nov 29, 2007
Koninklijke Philips Electronics N.V.
Paul Royston Harvey
G01 - MEASURING TESTING