Luc Vanderheydt

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Heverlee, BE

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Patents Grantslast 30 patents

Information Patent Grant
Detecting semiconductor substrate anomalies
- Patent number 8,379,964
- Issue date Feb 19, 2013
- KLA-Tencor Corporation
- Dominque Janssens
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining a position of at least one lead o...
- Patent number 5,440,391
- Issue date Aug 8, 1995
- ICOS Vision Systems n.v.
- Gust Smeyers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Detecting Semiconductor Substrate Anomalies
- Publication number 20110123091
- Publication date May 26, 2011
- ICOS VISION SYSTEMS NV
- Dominque Janssens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus for three dimensional measuring on an electronic component
- Publication number 20070023716
- Publication date Feb 1, 2007
- ICOS VISION SYSTEMS N.V.
- Maarten van der Burgt
- G06 - COMPUTING CALCULATING COUNTING