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Patents Grants
last 30 patents
Information
Patent Grant
MEMS sensor with compensation of residual voltage
Patent number
12,174,215
Issue date
Dec 24, 2024
Invensense, Inc.
Giacomo Gafforelli
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Capacitance gap measurement
Patent number
12,017,907
Issue date
Jun 25, 2024
Invensense, Inc.
Edoardo Belloni
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Robust method for gyroscope drive amplitude measurement
Patent number
11,867,509
Issue date
Jan 9, 2024
Invensense, Inc.
Damiano Milani
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS design with shear force rejection for reduced offset
Patent number
11,761,977
Issue date
Sep 19, 2023
Invensense, Inc.
Varun Subramaniam Kumar
G01 - MEASURING TESTING
Information
Patent Grant
Out-of-plane sensing gyroscope robust to external acceleration and...
Patent number
11,415,418
Issue date
Aug 16, 2022
Invensense, Inc.
Jaakko Ruohio
G01 - MEASURING TESTING
Information
Patent Grant
MEMS structure for offset minimization of out-of-plane sensing acce...
Patent number
11,231,441
Issue date
Jan 25, 2022
Invensense, Inc.
Giacomo Laghi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Robust method for tuning of gyroscope demodulation phase
Patent number
11,125,560
Issue date
Sep 21, 2021
Invensense, Inc.
Pietro Scafidi
G01 - MEASURING TESTING
Information
Patent Grant
Microelectromechanical structure with enhanced rejection of acceler...
Patent number
11,079,229
Issue date
Aug 3, 2021
STMicroelectronics S.r.l.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
MEMS sensor with compensation of residual voltage
Patent number
10,877,063
Issue date
Dec 29, 2020
Invensense, Inc.
Giacomo Gafforelli
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Identification and compensation of MEMS accelerometer errors
Patent number
10,725,068
Issue date
Jul 28, 2020
Invensense, Inc.
Giacomo Gafforelli
G01 - MEASURING TESTING
Information
Patent Grant
Yaw rate gyroscope robust to linear and angular acceleration
Patent number
10,704,908
Issue date
Jul 7, 2020
Invensense, Inc.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
Anchoring structure for a sensor insensitive to anchor movement
Patent number
10,655,963
Issue date
May 19, 2020
Invensense, Inc.
Jaakko Ruohio
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Residual voltage self test
Patent number
10,564,179
Issue date
Feb 18, 2020
Panasonic Corporation
Giacomo Gafforelli
G01 - MEASURING TESTING
Information
Patent Grant
Deformation rejection mechanism for offset minimization of out-of-p...
Patent number
10,551,191
Issue date
Feb 4, 2020
Invensense, Inc.
Giacomo Laghi
G01 - MEASURING TESTING
Information
Patent Grant
Out-of-plane sensing gyroscope robust to external acceleration and...
Patent number
10,466,053
Issue date
Nov 5, 2019
Invensense, Inc.
Jaakko Ruohio
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer sense path self-test
Patent number
10,379,137
Issue date
Aug 13, 2019
Panasonic Corporation
Giacomo Gafforelli
G01 - MEASURING TESTING
Information
Patent Grant
Yaw rate gyroscope robust to linear and angular acceleration
Patent number
10,359,284
Issue date
Jul 23, 2019
Invensense, Inc.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer common mode self-test
Patent number
10,317,426
Issue date
Jun 11, 2019
Panasonic Corporation
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
Microelectromechanical structure with enhanced rejection of acceler...
Patent number
10,209,071
Issue date
Feb 19, 2019
STMicroelectronics S.r.l.
Luca Coronato
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Dual-sealed MEMS package with cavity pressure monitoring
Patent number
10,209,157
Issue date
Feb 19, 2019
Invensense, Inc.
Luca Coronato
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Integrated microelectromechanical gyroscope with improved driving s...
Patent number
10,168,154
Issue date
Jan 1, 2019
STMicroelectronics S.r.l.
Gabriele Cazzaniga
G01 - MEASURING TESTING
Information
Patent Grant
Gyroscope with auxiliary self-test
Patent number
10,139,229
Issue date
Nov 27, 2018
Panasonic Corporation
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
Two frequency gyroscope compensation system and method
Patent number
10,088,315
Issue date
Oct 2, 2018
Invensense, Inc.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
Identification of a seal failure in MEMS devices
Patent number
10,041,854
Issue date
Aug 7, 2018
Panasonic Corporation
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for quadrature error compensation
Patent number
9,897,460
Issue date
Feb 20, 2018
Maxim Integrated Products, Inc.
Luca Coronato
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micro rate of rotation sensor and method for operating a micro rate...
Patent number
9,784,580
Issue date
Oct 10, 2017
Hanking Electronics Ltd.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
Microelectromechanical structure with enhanced rejection of acceler...
Patent number
9,739,613
Issue date
Aug 22, 2017
STMicroelectronics S.r.l.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
Recovery system and methods for MEMS devices
Patent number
9,517,930
Issue date
Dec 13, 2016
Hanking Electronics, Ltd.
Gabriele Cazzaniga
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Microelectromechanical gyroscope with rotary driving motion and imp...
Patent number
9,470,526
Issue date
Oct 18, 2016
STMicroelectronics S.r.l.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Grant
MEMS pressure sensor with improved insensitivity to thermo-mechanic...
Patent number
9,352,955
Issue date
May 31, 2016
Maxim Integrated Products, Inc.
Antonio Molfese
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
ANTI-STICTION ELECTRODES
Publication number
20250197193
Publication date
Jun 19, 2025
InvenSense, Inc.
Roberto Martini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVE AND SENSE BALANCED GYROSCOPE WITH ENHANCED VIBRATION REJECTION
Publication number
20250146820
Publication date
May 8, 2025
InvenSense, Inc.
Lorenzo Bertini
G01 - MEASURING TESTING
Information
Patent Application
DEFORMATION MAPPING FOR OUT-OF-PLANE ACCELEROMETER OFFSET/SENSITIVI...
Publication number
20240425354
Publication date
Dec 26, 2024
InvenSense, Inc.
Roberto Martini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MULTI-LEVEL MEMS PROCESS
Publication number
20240351864
Publication date
Oct 24, 2024
InvenSense, Inc.
Roberto Martini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DUAL AXIS ACCELEROMETER WITH COMPENSATION ELECTRODES
Publication number
20240302405
Publication date
Sep 12, 2024
InvenSense, Inc.
Roberto Martini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DUAL-SEALED ACCELEROMETER WITH CAVITY PRESSURE MONITORING
Publication number
20240183877
Publication date
Jun 6, 2024
InvenSense, Inc.
Adolfo Giambastiani
G01 - MEASURING TESTING
Information
Patent Application
ANCHOR DESIGN WITH REJECTION OF EXTERNAL SHEAR FORCE
Publication number
20230365397
Publication date
Nov 16, 2023
InvenSense, Inc.
Mrigank Sharma
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ROBUST METHOD FOR GYROSCOPE DRIVE AMPLITUDE MEASUREMENT
Publication number
20220282973
Publication date
Sep 8, 2022
InvenSense, Inc.
Damiano Milani
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
CAPACITANCE GAP MEASUREMENT
Publication number
20220234883
Publication date
Jul 28, 2022
InvenSense, Inc.
Edoardo Belloni
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Mems sensor with compensation of residual voltage
Publication number
20210102970
Publication date
Apr 8, 2021
InvenSense, Inc.
Giacomo Gafforelli
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ROBUST METHOD FOR TUNING OF GYROSCOPE DEMODULATION PHASE
Publication number
20210033396
Publication date
Feb 4, 2021
InvenSense, Inc.
Pietro Scafidi
G01 - MEASURING TESTING
Information
Patent Application
MEMS STRUCTURE FOR OFFSET MINIMIZATION OF OUT-OF-PLANE SENSING ACCE...
Publication number
20200233011
Publication date
Jul 23, 2020
InvenSense, Inc.
Giacomo Laghi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
YAW RATE GYROSCOPE ROBUST TO LINEAR AND ANGULAR ACCELERATION
Publication number
20200208975
Publication date
Jul 2, 2020
InvenSense, Inc.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
OUT-OF-PLANE SENSING GYROSCOPE ROBUST TO EXTERNAL ACCELERATION AND...
Publication number
20200096338
Publication date
Mar 26, 2020
InvenSense, Inc.
Jaakko Ruohio
G01 - MEASURING TESTING
Information
Patent Application
MICROELECTROMECHANICAL STRUCTURE WITH ENHANCED REJECTION OF ACCELER...
Publication number
20190162540
Publication date
May 30, 2019
STMicroelectronics S.r.l.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
OUT-OF-PLANE SENSING GYROSCOPE ROBUST TO EXTERNAL ACCELERATION AND...
Publication number
20180283867
Publication date
Oct 4, 2018
InvenSense, Inc.
Jaakko Ruohio
G01 - MEASURING TESTING
Information
Patent Application
DEFORMATION REJECTION MECHANISM FOR OFFSET MINIMIZATION OF OUT-OF-P...
Publication number
20180245920
Publication date
Aug 30, 2018
InvenSense, Inc.
Giacomo Laghi
G01 - MEASURING TESTING
Information
Patent Application
ANCHORING STRUCTURE FOR A SENSOR INSENSITIVE TO ANCHOR MOVEMENT
Publication number
20180238689
Publication date
Aug 23, 2018
InvenSense, Inc.
Jaakko Ruohio
G01 - MEASURING TESTING
Information
Patent Application
MICROELECTROMECHANICAL STRUCTURE WITH ENHANCED REJECTION OF ACCELER...
Publication number
20170322028
Publication date
Nov 9, 2017
STMicroelectronics S.r.l.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
YAW RATE GYROSCOPE ROBUST TO LINEAR AND ANGULAR ACCELERATION
Publication number
20170234684
Publication date
Aug 17, 2017
INVENSENSE INTERNATIONAL, INC.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
IDENTIFICATION OF A SEAL FAILURE IN MEMS DEVICES
Publication number
20170167945
Publication date
Jun 15, 2017
INVENSENSE INTERNATIONAL, INC.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER SENSE PATH SELF-TEST
Publication number
20170168086
Publication date
Jun 15, 2017
INVENSENSE INTERNATIONAL, INC.
Giacomo Gafforelli
G01 - MEASURING TESTING
Information
Patent Application
MEMS SENSOR WITH COMPENSATION OF RESIDUAL VOLTAGE
Publication number
20170168085
Publication date
Jun 15, 2017
INVENSENSE INTERNATIONAL, INC.
Giacomo Gafforelli
G01 - MEASURING TESTING
Information
Patent Application
IDENTIFICATION AND COMPENSATION OF MEMS ACCELEROMETER ERRORS
Publication number
20170168087
Publication date
Jun 15, 2017
INVENSENSE INTERNATIONAL, INC.
Giacomo Gafforelli
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER COMMON MODE SELF-TEST
Publication number
20170168088
Publication date
Jun 15, 2017
InvenSense, Inc.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
RESIDUAL VOLTAGE SELF TEST
Publication number
20170168084
Publication date
Jun 15, 2017
INVENSENSE INTERNATIONAL, INC.
Giacomo Gafforelli
G01 - MEASURING TESTING
Information
Patent Application
DUAL-SEALED MEMS PACKAGE WITH CAVITY PRESSURE MONITORING
Publication number
20170167946
Publication date
Jun 15, 2017
InvenSense, Inc.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
TWO FREQUENCY GYROSCOPE COMPENSATION SYSTEM AND METHOD
Publication number
20170167873
Publication date
Jun 15, 2017
INVENSENSE INTERNATIONAL, INC.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
GYROSCOPE WITH AUXILIARY SELF-TEST
Publication number
20170167876
Publication date
Jun 15, 2017
INVENSENSE INTERNATIONAL, INC.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
MICROELECTROMECHANICAL STRUCTURE WITH ENHANCED REJECTION OF ACCELER...
Publication number
20170059322
Publication date
Mar 2, 2017
STMicroelectronics S.r.l.
Luca Coronato
G01 - MEASURING TESTING