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Lucas Paul Keranen
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Hutchinson, MN, US
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Patents Grants
last 30 patents
Information
Patent Grant
High temperature heating system
Patent number
10,241,017
Issue date
Mar 26, 2019
Bruker Nano, Inc.
Lucas Paul Keranen
G01 - MEASURING TESTING
Information
Patent Grant
Environmental conditioning assembly for use in mechanical testing a...
Patent number
9,829,417
Issue date
Nov 28, 2017
Hysitron, Inc.
Roger William Schmitz
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Grant
High temperature heating system
Patent number
9,804,072
Issue date
Oct 31, 2017
Hysitron, Inc.
Syed Amanulla Syed Asif
G01 - MEASURING TESTING
Information
Patent Grant
Mechanical testing instruments including onboard data
Patent number
9,194,727
Issue date
Nov 24, 2015
Hysitron, Inc.
Christopher David Young
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nanomechanical testing system
Patent number
8,959,980
Issue date
Feb 24, 2015
Hysitron, Inc.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Grant
Nanomechanical testing system
Patent number
8,939,041
Issue date
Jan 27, 2015
Hysitron, Inc.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Grant
Nanomechanical testing system
Patent number
8,770,036
Issue date
Jul 8, 2014
Hysitron, Inc.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Grant
Indenter assembly
Patent number
8,631,687
Issue date
Jan 21, 2014
Hysitron, Inc.
Justin D. Patten
G01 - MEASURING TESTING
Information
Patent Grant
Method for de-tabbing a disk drive head suspension flexure
Patent number
7,549,211
Issue date
Jun 23, 2009
Hutchinson Technology Incorporated
Lucas P. Keranen
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
ENVIRONMENTAL CONDITIONING ASSEMBLY FOR USE IN MECHANICAL TESTING A...
Publication number
20150185117
Publication date
Jul 2, 2015
HYSITRON, INC.
Roger William Schmitz
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Application
HIGH TEMPERATURE HEATING SYSTEM
Publication number
20150033835
Publication date
Feb 5, 2015
HYSITRON, INC.
Syed Amanulla Syed Asif
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPERATURE HEATING SYSTEM
Publication number
20140331782
Publication date
Nov 13, 2014
Lucas Paul Keranen
G01 - MEASURING TESTING
Information
Patent Application
NANOMECHANICAL TESTING SYSTEM
Publication number
20140293293
Publication date
Oct 2, 2014
HYSITRON, INC.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Application
MECHANICAL TESTING INSTRUMENTS INCLUDING ONBOARD DATA
Publication number
20130332100
Publication date
Dec 12, 2013
Christopher David Young
B82 - NANO-TECHNOLOGY
Information
Patent Application
NANOMECHANICAL TESTING SYSTEM
Publication number
20130319127
Publication date
Dec 5, 2013
HYSITRON, INC.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Application
NANOMECHANICAL TESTING SYSTEM
Publication number
20130319071
Publication date
Dec 5, 2013
HYSITRON, INC.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Application
INDENTER ASSEMBLY
Publication number
20110252874
Publication date
Oct 20, 2011
HYSITRON, INC.
Justin D. Patten
G01 - MEASURING TESTING