Lucian Scurtu

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Codlea, RO

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for testing semiconductor devices
- Patent number 11,594,435
- Issue date Feb 28, 2023
- Testmetrix, Inc.
- Christian O. Cojocneanu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for testing semiconductor devices
- Patent number 11,237,208
- Issue date Feb 1, 2022
- Testmetrix, Inc.
- Christian O. Cojocneanu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing semiconductor devices
- Patent number 7,755,374
- Issue date Jul 13, 2010
- Christian O. Cojocneanu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for Testing Semiconductor Devices
- Publication number 20240329134
- Publication date Oct 3, 2024
- Testmetrix, Inc.
- Christian O. Cojocneanu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Testing Semiconductor Devices
- Publication number 20220137132
- Publication date May 5, 2022
- Testmetrix, Inc.
- Christian O. Cojocneanu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for Testing Semiconductor Devices
- Publication number 20200273733
- Publication date Aug 27, 2020
- Testmetrix, Inc.
- Christian O. Cojocneanu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Testing Semiconductor Devices
- Publication number 20200041564
- Publication date Feb 6, 2020
- Testmetrix, Inc.
- Christian O. Cojocneanu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus and Methods for Testing Semiconductor Devices
- Publication number 20180197762
- Publication date Jul 12, 2018
- Christian O. Cojocneanu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080191725
- Publication date Aug 14, 2008
- TESTMETRIX, INC.
- Christian O. Cojocneanu
- G01 - MEASURING TESTING