Lucie Rousseville

Follow

Person

Waldolwisheim, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Embedded structure for passivation integrity testing
- Patent number 8,519,388
- Issue date Aug 27, 2013
- NXP B.V.
- Lucie A. Rousseville
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and wafer with a test structure and method for...
- Patent number 8,395,399
- Issue date Mar 12, 2013
- NXP B.V.
- Lucie Rousseville
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EMBEDDED STRUCTURE FOR PASSIVATION INTEGRITY TESTING
- Publication number 20110140104
- Publication date Jun 16, 2011
- NXP B.V.
- Lucie A. Rousseville
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND WAFER WITH A TEST STRUCTURE AND METHOD FOR...
- Publication number 20100253372
- Publication date Oct 7, 2010
- NXP B.V.
- Lucie Rousseville
- G01 - MEASURING TESTING