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Lucille A. Giannuzzi
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Orlando, FL, US
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Patents Grants
last 30 patents
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Patent Grant
Stage assembly, particle-optical apparatus comprising such a stage...
Patent number
7,474,419
Issue date
Jan 6, 2009
FEI Company
Hendrik Gezinus Tappel
G01 - MEASURING TESTING
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Patent Grant
Repetitive circumferential milling for sample preparation
Patent number
7,442,924
Issue date
Oct 28, 2008
FEI, Company
Lucille A. Giannuzzi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Stage assembly, particle-optical apparatus comprising such a stage...
Publication number
20070125958
Publication date
Jun 7, 2007
FEI Company
Hendrik Gezinus Tappel
G01 - MEASURING TESTING
Information
Patent Application
Repetitive circumferential milling for sample preparation
Publication number
20060186336
Publication date
Aug 24, 2006
FEI Company
Lucille A. Giannuzzi
G01 - MEASURING TESTING