Ludger Schulte

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Schriesheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for examining an object using a microscope with delayed cont...
- Patent number 8,735,790
- Issue date May 27, 2014
- Leica Microsystems CMS GmbH
- Ludger Schulte
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EXAMINING AN OBJECT WITH THE AID OF A MICROSCOPE AND A M...
- Publication number 20110149290
- Publication date Jun 23, 2011
- Leica Microsystems CMS GmbH
- Ludger Schulte
- G02 - OPTICS