Ludwig Koester

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Burghausen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and appartus for detection of mechanical defects in an ingot...
- Patent number 8,038,895
- Issue date Oct 18, 2011
- Siltronic AG
- Ludwig Koester
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING THE STRESS ROBUSTNESS OF A SEMICONDUCTOR SUBSTRATE
- Publication number 20240105523
- Publication date Mar 28, 2024
- Siltronic AG
- Ludwig Koester
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING SEMICONDUCTOR WAFERS
- Publication number 20220236205
- Publication date Jul 28, 2022
- Siltronic AG
- Michael BOY
- C30 - CRYSTAL GROWTH
Information Patent Application
Method and Appartus For Detection Of Mechanical Defects In An Ingot...
- Publication number 20080041159
- Publication date Feb 21, 2008
- Siltronic AG
- Ludwig Koester
- G01 - MEASURING TESTING