Luigi Mele

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and devices for preparing sample for cryogenic electron mic...
- Patent number 10,921,268
- Issue date Feb 16, 2021
- FEI Company
- Bas Hendriksen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emission noise correction of a charged particle source
- Patent number 10,453,647
- Issue date Oct 22, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collision ionization source
- Patent number 10,325,750
- Issue date Jun 18, 2019
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collision ionization ion source
- Patent number 9,899,181
- Issue date Feb 20, 2018
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder assembly for cooperating with a nanoreactor and an electron...
- Patent number 9,812,285
- Issue date Nov 7, 2017
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing spectroscopy in a transmission charged-particl...
- Patent number 9,778,377
- Issue date Oct 3, 2017
- FEI Company
- Luigi Mele
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Micro-chamber for inspecting sample material
- Patent number 9,741,529
- Issue date Aug 22, 2017
- FEI Company
- Luigi Mele
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Detectors For Microscopy
- Publication number 20240242929
- Publication date Jul 18, 2024
- FEI Company
- Luigi Mele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simple Spherical Aberration Corrector for SEM
- Publication number 20240047170
- Publication date Feb 8, 2024
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle optics components and their fabrication
- Publication number 20240047171
- Publication date Feb 8, 2024
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES FOR PREPARING SAMPLE FOR CRYOGENIC ELECTRON MIC...
- Publication number 20210072170
- Publication date Mar 11, 2021
- FEI Company
- Bas HENDRIKSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMISSION NOISE CORRECTION OF A CHARGED PARTICLE SOURCE
- Publication number 20180233322
- Publication date Aug 16, 2018
- FEI Company
- Ali Mohammadi Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION IONIZATION SOURCE
- Publication number 20180211807
- Publication date Jul 26, 2018
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLDER ASSEMBLY FOR COOPERATING WITH A NANOREACTOR AND AN ELECTRON...
- Publication number 20170213691
- Publication date Jul 27, 2017
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO-CHAMBER FOR INSPECTING SAMPLE MATERIAL
- Publication number 20170032928
- Publication date Feb 2, 2017
- FEI Company
- Luigi Mele
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICL...
- Publication number 20160276130
- Publication date Sep 22, 2016
- FEI Company
- Luigi Mele
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Methods and devices for preparing sample for cryogenic electron mic...

Emission noise correction of a charged particle source

Collision ionization source

Collision ionization ion source

Holder assembly for cooperating with a nanoreactor and an electron...

Method of performing spectroscopy in a transmission charged-particl...

Micro-chamber for inspecting sample material

Patents Applicationslast 30 patents

Detectors For Microscopy

Simple Spherical Aberration Corrector for SEM

Charged particle optics components and their fabrication

METHODS AND DEVICES FOR PREPARING SAMPLE FOR CRYOGENIC ELECTRON MIC...

EMISSION NOISE CORRECTION OF A CHARGED PARTICLE SOURCE

COLLISION IONIZATION SOURCE

HOLDER ASSEMBLY FOR COOPERATING WITH A NANOREACTOR AND AN ELECTRON...

MICRO-CHAMBER FOR INSPECTING SAMPLE MATERIAL

METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICL...