Luigi PANTISANO

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Saratoga Springs, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with doped region adjacent isolation structure...
- Patent number 11,195,947
- Issue date Dec 7, 2021
- GLOBALFOUNDRIES U.S. INC.
- Jagar Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, apparatus and system for forming a FinFET device comprisin...
- Patent number 10,438,853
- Issue date Oct 8, 2019
- GLOBALFOUNDRIES Inc.
- Shahab Siddiqui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for quantifying defects due to through silicon...
- Patent number 9,335,368
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- Luigi Pantisano
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE WITH DOPED REGION ADJACENT ISOLATION STRUCTURE...
- Publication number 20210126126
- Publication date Apr 29, 2021
- GLOBALFOUNDRIES U.S. Inc.
- Jagar Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE SKIRT OXIDATION FOR IMPROVED FINFET PERFORMANCE AND METHOD FOR...
- Publication number 20190305105
- Publication date Oct 3, 2019
- GLOBALFOUNDRIES INC.
- Qun GAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR FORMING A FINFET DEVICE COMPRISIN...
- Publication number 20190157157
- Publication date May 23, 2019
- GLOBALFOUNDRIES INC.
- Shahab Siddiqui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR QUANTIFYING DEFECTS DUE TO THROUGH SILICON...
- Publication number 20160116526
- Publication date Apr 28, 2016
- GLOBAL FOUNDRIES Inc.
- Luigi PANTISANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INLINE DEVICE CHARACTERIZATION AND TEMPERA...
- Publication number 20150377956
- Publication date Dec 31, 2015
- GLOBALFOUNDRIES INC.
- William MCMAHON
- G01 - MEASURING TESTING