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Luigi Scaccabarozzi
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Warkenswaard, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Membranes for use within a lithographic apparatus and a lithographi...
Patent number
10,698,312
Issue date
Jun 30, 2020
ASML Netherlands B.V.
Pieter-Jan Van Zwol
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Suppression filter, radiation collector and radiation source for a...
Patent number
10,678,140
Issue date
Jun 9, 2020
ASML Netherlands B.V.
Vadim Yevgenyevich Banine
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Membranes for use within a lithographic apparatus and a lithographi...
Patent number
10,228,615
Issue date
Mar 12, 2019
ASML Netherlands B.V.
Andrey Alexandrovich Nikipelov
G02 - OPTICS
Information
Patent Grant
Lithographic apparatus
Patent number
10,139,725
Issue date
Nov 27, 2018
ASML Netherlands B.V.
James Norman Wiley
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus and method of manufacturing a device
Patent number
9,606,445
Issue date
Mar 28, 2017
ASML Netherlands B.V.
Vadim Yevgenyevich Banine
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus and device manufacturing method
Patent number
9,563,137
Issue date
Feb 7, 2017
ASML Netherlands B.V.
Nicolaas Arnoldus Lammers
B08 - CLEANING
Information
Patent Grant
Methods and apparatus for inspection of articles, EUV lithography r...
Patent number
9,488,922
Issue date
Nov 8, 2016
ASML Netherlands B.V.
Yuri Vainer
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Radiation source apparatus, lithographic apparatus, method of gener...
Patent number
9,298,110
Issue date
Mar 29, 2016
ASML Netherlands B.V.
Jens Arno Steinhoff
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Object inspection systems and methods
Patent number
9,122,178
Issue date
Sep 1, 2015
ASML Netherlands B.V.
Vitalii Ivanov
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and apparatus
Patent number
8,830,455
Issue date
Sep 9, 2014
ASML Netherlands B.V.
Arie Jeffrey Den Boef
G01 - MEASURING TESTING
Information
Patent Grant
Particle cleaning of optical elements for microlithography
Patent number
8,477,285
Issue date
Jul 2, 2013
Carl Zeiss SMT GmbH
Dirk Heinrich Ehm
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of detecting a particle and a lithographic apparatus
Patent number
8,405,825
Issue date
Mar 26, 2013
ASML Netherlands B.V.
Luigi Scaccabarozzi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEMBRANES FOR USE WITHIN A LITHOGRAPHIC APPARATUS AND A LITHOGRAPHI...
Publication number
20190146332
Publication date
May 16, 2019
ASML NETHERLANDS B.V.
Pieter-Jan VAN ZWOL
G02 - OPTICS
Information
Patent Application
SUPPRESSION FILTER, RADIATION COLLECTOR AND RADIATION SOURCE FOR A...
Publication number
20180246414
Publication date
Aug 30, 2018
ASML NETHERLANDS B.V.
Vadim Yevgenyevich BANINE
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MEMBRANES FOR USE WITHIN A LITHOGRAPHIC APPARATUS AND A LITHOGRAPHI...
Publication number
20170205704
Publication date
Jul 20, 2017
ASML NETHERLANDS B.V.
Andrey Alexandrovich NIKIPELOV
G02 - OPTICS
Information
Patent Application
Lithographic Apparatus
Publication number
20160033860
Publication date
Feb 4, 2016
ASML NETHERLANDS B.V.
James Norman WILEY
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Lithographic Apparatus and Method of Manufacturing a Device
Publication number
20150192861
Publication date
Jul 9, 2015
ASML NETHERLANDS B.V.
Vadim Yevgenyevich Banine
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Apparatus for Monitoring a Lithographic Patterning Device
Publication number
20140340663
Publication date
Nov 20, 2014
ASML NETHERLANDS B.V.
Luigi Scaccabarozzi
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Inspection of Articles, EUV Lithography R...
Publication number
20140146297
Publication date
May 29, 2014
ASML NETHERLANDS B.V.
Yuri Vainer
G01 - MEASURING TESTING
Information
Patent Application
GAS-LIQUID PHASE TRANSITION METHOD AND APPARATUS FOR CLEANING OF SU...
Publication number
20140014138
Publication date
Jan 16, 2014
Jeffrey J. Spiegelman
B08 - CLEANING
Information
Patent Application
Electrostatic Clamp Apparatus And Lithographic Apparatus
Publication number
20140002805
Publication date
Jan 2, 2014
ASML Netherelands B.V.
Vadim Yevgenyevich Banine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM FOR REMOVING CONTAMINANT PARTICLES, LITHOGRAPHIC APPARATUS,...
Publication number
20130070218
Publication date
Mar 21, 2013
ASML Netherland B.V.
Vladimir Vitalevich Ivanov
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Methods and Apparatus for Inspection Of Articles, EUV Lithography R...
Publication number
20120182538
Publication date
Jul 19, 2012
ASML NETHERLANDS B.V.
Roelof Koole
G01 - MEASURING TESTING
Information
Patent Application
Object Inspection Systems and Methods
Publication number
20120127467
Publication date
May 24, 2012
ASML Netherland B.V.
Vitalii Ivanov
G01 - MEASURING TESTING
Information
Patent Application
LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
Publication number
20120086929
Publication date
Apr 12, 2012
ASML NETHERLANDS B.V.
Nicolaas Arnoldus Lammers
B08 - CLEANING
Information
Patent Application
Object Inspection Systems and Methods
Publication number
20120081684
Publication date
Apr 5, 2012
ASML NETHERLANDS B.V.
Arie Jeffrey Den Oef
G01 - MEASURING TESTING
Information
Patent Application
RADIATION SOURCE APPARATUS, LITHOGRAPHIC APPARATUS, METHOD OF GENER...
Publication number
20110222040
Publication date
Sep 15, 2011
ASML NETHERLANDS B.V.
Jens Arno STEINHOFF
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
PARTICLE CLEANING OF OPTICAL ELEMENTS FOR MICROLITHOGRAPHY
Publication number
20110188011
Publication date
Aug 4, 2011
Carl Zeiss SMT GMBH
Dirk Heinrich EHM
B82 - NANO-TECHNOLOGY
Information
Patent Application
Lithographic Apparatus and Device Manufacturing Method
Publication number
20110170083
Publication date
Jul 14, 2011
ASML NETHERLANDS B.V.
Luigi Scaccabarozzi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of Detecting a Particle and a Lithographic Apparatus
Publication number
20110149276
Publication date
Jun 23, 2011
ASML NETHERLANDS B.V.
Luigi SCACCABAROZZI
G01 - MEASURING TESTING
Information
Patent Application
Inspection method and apparatus
Publication number
20110043795
Publication date
Feb 24, 2011
ASML NETHERLANDS B.V.
Arie Jeffrey Den Boef
G01 - MEASURING TESTING
Information
Patent Application
LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD, CLEANING SYSTE...
Publication number
20110037960
Publication date
Feb 17, 2011
ASML NETHERLANDS B.V.
Luigi Scaccabarozzi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EUV Mask Inspection
Publication number
20100165310
Publication date
Jul 1, 2010
ASML Holding N.V.
Harry SEWELL
G01 - MEASURING TESTING
Information
Patent Application
System for Contactless Cleaning, Lithographic Apparatus and Device...
Publication number
20100151394
Publication date
Jun 17, 2010
Luigi Scaccabarozzi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY