Membership
Tour
Register
Log in
Luis Elvira Villagra
Follow
Person
Eindhoven, NL
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Testable integrated circuit and IC test method
Patent number
8,138,783
Issue date
Mar 20, 2012
NXP B.V.
Josep Rius Vazquez
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD
Publication number
20090315583
Publication date
Dec 24, 2009
NXP, B.V.
Josep Rius Vazquez
G01 - MEASURING TESTING