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Lukas E. HOWALD
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Dornach, CH
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for automated scanning probe microscopy
Patent number
9,448,393
Issue date
Sep 20, 2016
NUOMEDIS AG
Robert Sum
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Raster scanning microscope having transparent optical element with...
Patent number
7,759,631
Issue date
Jul 20, 2010
Nanosurf AG
Lukas E. Howald
G01 - MEASURING TESTING
Information
Patent Grant
Scanning tip and process for its production and use, particularly f...
Patent number
6,767,696
Issue date
Jul 27, 2004
Nanosurf AG
Lukas Howald
G01 - MEASURING TESTING
Information
Patent Grant
Multiaxis actuator and measuring head, especially for a scanning pr...
Patent number
6,525,316
Issue date
Feb 25, 2003
Nanosurf AG
Lukas E. Howald
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR AUTOMATED SCANNING PROBE MICROSCOPY
Publication number
20150241468
Publication date
Aug 27, 2015
Nuomedis AG
Robert SUM
G02 - OPTICS
Information
Patent Application
OPTICAL DETECTION SYSTEM FOR MICROMECHANICAL CANTILEVERS, ESPECIALL...
Publication number
20090184242
Publication date
Jul 23, 2009
NANOSURF AG
Lukas E. HOWALD
G01 - MEASURING TESTING
Information
Patent Application
Scanning tip and process for its production and use, particularly f...
Publication number
20010050342
Publication date
Dec 13, 2001
Lukas Howald
B82 - NANO-TECHNOLOGY