Lukas Kral

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Ivancice, CZ

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Patents Grantslast 30 patents

Information Patent Grant
System and method for beam position visualization
- Patent number 10,998,166
- Issue date May 4, 2021
- FEI Company
- Branislav Straka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam impurity identification
- Patent number 10,763,079
- Issue date Sep 1, 2020
- FEI Company
- Jeremy Graham
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR BEAM POSITION VISUALIZATION
- Publication number 20210035775
- Publication date Feb 4, 2021
- FEI Company
- Branislav Straka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM IMPURITY IDENTIFICATION
- Publication number 20200266030
- Publication date Aug 20, 2020
- FEI Company
- Jeremy Graham
- G01 - MEASURING TESTING