Lukas Novotny

Person

Pittsford, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Metallic nano-tip apparatus, methods, and applications
- Patent number 9,228,265
- Issue date Jan 5, 2016
- University of Rochester
- Lukas Novotny
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrated microscope and related methods and devices
- Patent number 8,997,260
- Issue date Mar 31, 2015
- Ryan Murdick
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Common-path interferometer rendering amplitude and phase of scatter...
- Patent number 7,876,450
- Issue date Jan 25, 2011
- University of Rochester
- Lukas Novotny
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for sizing nanoparticles based on interferomet...
- Patent number 7,528,959
- Issue date May 5, 2009
- University of Rochester
- Lukas Novotny
- G01 - MEASURING TESTING
Information Patent Grant
System and method for high resolution optical imaging, data storage...
- Patent number 7,526,158
- Issue date Apr 28, 2009
- University of Rochester
- Lukas Novotny
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METALLIC NANO-TIP APPARATUS, METHODS, AND APPLICATIONS
- Publication number 20150191003
- Publication date Jul 9, 2015
- Regents of the University of Minnesota
- Lukas Novotny
- B32 - LAYERED PRODUCTS
Information Patent Application
Integrated Microscope and Related Methods and Devices
- Publication number 20130333077
- Publication date Dec 12, 2013
- RHK Technology , Inc.
- Ryan Murdick
- B82 - NANO-TECHNOLOGY
Information Patent Application
STACKED OPTICAL ANTENNA STRUCTURES, METHODS AND APPLICATIONS
- Publication number 20120040127
- Publication date Feb 16, 2012
- University of Rochester
- Lukas Novotny
- B32 - LAYERED PRODUCTS
Information Patent Application
Multi-color hetereodyne interferometric apparatus and method for si...
- Publication number 20090323061
- Publication date Dec 31, 2009
- Lukas Novotny
- G01 - MEASURING TESTING
Information Patent Application
COMMON-PATH INTERFEROMETER RENDERING AMPLITUDE AND PHASE OF SCATTER...
- Publication number 20090257057
- Publication date Oct 15, 2009
- Lukas Novotny
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SIZING NANOPARTICLES BASED ON INTERFEROMET...
- Publication number 20080218766
- Publication date Sep 11, 2008
- Lukas Novotny
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for sizing nanoparticles based on optical forc...
- Publication number 20070030492
- Publication date Feb 8, 2007
- Lukas Novotny
- G01 - MEASURING TESTING
Information Patent Application
System and method for high resolution optical imaging, data storage...
- Publication number 20020114567
- Publication date Aug 22, 2002
- Lukas Novotny
- B82 - NANO-TECHNOLOGY

Lukas Novotny

Person

Patents Grantslast 30 patents

Metallic nano-tip apparatus, methods, and applications

Integrated microscope and related methods and devices

Common-path interferometer rendering amplitude and phase of scatter...

Apparatus and method for sizing nanoparticles based on interferomet...

System and method for high resolution optical imaging, data storage...

Patents Applicationslast 30 patents

METALLIC NANO-TIP APPARATUS, METHODS, AND APPLICATIONS

Integrated Microscope and Related Methods and Devices

STACKED OPTICAL ANTENNA STRUCTURES, METHODS AND APPLICATIONS

Multi-color hetereodyne interferometric apparatus and method for si...

COMMON-PATH INTERFEROMETER RENDERING AMPLITUDE AND PHASE OF SCATTER...

APPARATUS AND METHOD FOR SIZING NANOPARTICLES BASED ON INTERFEROMET...

Apparatus and method for sizing nanoparticles based on optical forc...

System and method for high resolution optical imaging, data storage...