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Lukasz REDLARSKI
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Eindhoven, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Shape measuring method
Patent number
11,530,914
Issue date
Dec 20, 2022
Mitutoyo Corporation
Lukasz Redlarski
G02 - OPTICS
Information
Patent Grant
Method for measuring a height map of a test surface
Patent number
11,493,330
Issue date
Nov 8, 2022
Mitutoyo Corporation
Hendrik Ketelaars
G01 - MEASURING TESTING
Information
Patent Grant
Image sequence and evaluation method and system for structured illu...
Patent number
9,568,304
Issue date
Feb 14, 2017
Mitutoyo Corporation
Han Haitjema
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
SHAPE MEASURING METHOD
Publication number
20220034650
Publication date
Feb 3, 2022
MITUTOYO CORPORATION
Lukasz REDLARSKI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING A HEIGHT MAP OF A TEST SURFACE
Publication number
20210180943
Publication date
Jun 17, 2021
MITUTOYO CORPORATION
Hendrik KETELAARS
G01 - MEASURING TESTING
Information
Patent Application
IMAGE SEQUENCE AND EVALUATION METHOD AND SYSTEM FOR STRUCTURED ILLU...
Publication number
20150219441
Publication date
Aug 6, 2015
MITUTOYO CORPORATION
Han HAITJEMA
G02 - OPTICS