Luke D. LaCroix

Person

Williston, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit for detecting structural defects in an integrated circuit c...
- Patent number 9,599,664
- Issue date Mar 21, 2017
- GLOBALFOUNDRIES Inc.
- Luke D. Lacroix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Packaging identical chips in a stacked structure
- Patent number 9,093,445
- Issue date Jul 28, 2015
- International Business Machines Corporation
- Evan G. Colgan
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for detecting structural defects in an integrated circuit c...
- Patent number 9,057,760
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Luke D. Lacroix
- G01 - MEASURING TESTING
Information Patent Grant
Elongated via structures
- Patent number 8,999,846
- Issue date Apr 7, 2015
- International Business Machines Corporation
- Luke D. LaCroix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Elongated via structures
- Patent number 8,759,977
- Issue date Jun 24, 2014
- International Business Machines Corporation
- Luke D. LaCroix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for monitoring stress induced failures in interlevel diel...
- Patent number 8,653,662
- Issue date Feb 18, 2014
- International Business Machines Corporation
- Luke D. LaCroix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor test chip device to mimic field thermal mini-cycles t...
- Patent number 8,586,982
- Issue date Nov 19, 2013
- International Business Machines Corporation
- Luke D. LaCroix
- G01 - MEASURING TESTING
Information Patent Grant
Testing high I/O integrated circuits on a low I/O tester
- Patent number 6,260,163
- Issue date Jul 10, 2001
- International Business Machines Corporation
- Luke D. Lacroix
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT C...
- Publication number 20150247896
- Publication date Sep 3, 2015
- International Business Machines Corporation
- Luke D. Lacroix
- G01 - MEASURING TESTING
Information Patent Application
ELONGATED VIA STRUCTURES
- Publication number 20140227874
- Publication date Aug 14, 2014
- International Business Machines Corporation
- Luke D. LaCroix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR MONITORING STRESS INDUCED FAILURES IN INTE...
- Publication number 20130292817
- Publication date Nov 7, 2013
- International Business Machines Corporation
- Luke D. LaCroix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELONGATED VIA STRUCTURES
- Publication number 20130285251
- Publication date Oct 31, 2013
- International Business Machines Corporation
- Luke D. LaCroix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGING IDENTICAL CHIPS IN A STACKED STRUCTURE
- Publication number 20130049834
- Publication date Feb 28, 2013
- International Business Machines Corporation
- Evan G. Colgan
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT C...
- Publication number 20120187953
- Publication date Jul 26, 2012
- International Business Machines Corporation
- Luke D. LACROIX
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST CHIP DEVICE TO MIMIC FIELD THERMAL MINI-CYCLES T...
- Publication number 20120049874
- Publication date Mar 1, 2012
- International Business CorporationA
- Luke D. LaCroix
- G01 - MEASURING TESTING

Luke D. LaCroix

Person

Patents Grantslast 30 patents

Circuit for detecting structural defects in an integrated circuit c...

Packaging identical chips in a stacked structure

Circuit for detecting structural defects in an integrated circuit c...

Elongated via structures

Elongated via structures

Structure for monitoring stress induced failures in interlevel diel...

Semiconductor test chip device to mimic field thermal mini-cycles t...

Testing high I/O integrated circuits on a low I/O tester

Patents Applicationslast 30 patents

CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT C...

ELONGATED VIA STRUCTURES

STRUCTURE AND METHOD FOR MONITORING STRESS INDUCED FAILURES IN INTE...

ELONGATED VIA STRUCTURES

PACKAGING IDENTICAL CHIPS IN A STACKED STRUCTURE

CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT C...

SEMICONDUCTOR TEST CHIP DEVICE TO MIMIC FIELD THERMAL MINI-CYCLES T...