LukáLuká{hacek over (s)} Hübner

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Patents Grantslast 30 patents

Information Patent Grant
Depth reconstruction for 3D images of samples in a charged particle...
- Patent number 11,380,529
- Issue date Jul 5, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Slice depth reconstruction of charged particle images using model s...
- Patent number 11,282,670
- Issue date Mar 22, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lamella alignment based on a reconstructed volume
- Patent number 11,264,200
- Issue date Mar 1, 2022
- FEI Company
- TomáTomá{hacek over (s)} Onderlicka
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR PREPARING WEDGED LAMELLA
- Publication number 20230364688
- Publication date Nov 16, 2023
- FEI Company
- Jaroslav Stárek
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE
- Publication number 20230307209
- Publication date Sep 28, 2023
- FEI Company
- Zoltán Orémus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR AUTOMATED GRID VALIDATION
- Publication number 20230093535
- Publication date Mar 23, 2023
- FEI Company
- Pavol KARLÍK
- H01 - BASIC ELECTRIC ELEMENTS