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Lunyu Ma
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San Jose, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for adjusting a multi-substrate probe structure
Patent number
7,845,072
Issue date
Dec 7, 2010
FormFactor, Inc.
Eric D. Hobbs
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for adjusting a multi-substrate probe structure
Patent number
7,471,094
Issue date
Dec 30, 2008
FormFactor, Inc.
Eric D. Hobbs
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND APPARATUS FOR ADJUSTING A MULTI-SUBSTRATE PROBE STRUCTURE
Publication number
20090158586
Publication date
Jun 25, 2009
FormFactor, Inc.
Eric D. Hobbs
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for adjusting a multi-substrate probe structure
Publication number
20060290367
Publication date
Dec 28, 2006
FormFactor, Inc.
Eric D. Hobbs
G01 - MEASURING TESTING