Luyang Han

Follow

Person

Heidenheim, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Electron beam microscope
- Patent number 10,615,000
- Issue date Apr 7, 2020
- Carl Zeiss Microscopy GmbH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a pressure system of a device for imaging, ana...
- Patent number 10,546,716
- Issue date Jan 28, 2020
- Carl Zeiss Microscopy GmbH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF GENERATING A CRYSTALLINE ORIENTATION MAP OF A SURFACE POR...
- Publication number 20230178332
- Publication date Jun 8, 2023
- CARL ZEISS MICROSCOPY GMBH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM MICROSCOPE
- Publication number 20190304742
- Publication date Oct 3, 2019
- CARL ZEISS MICROSCOPY GMBH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PRESSURE SYSTEM OF A DEVICE FOR IMAGING, ANA...
- Publication number 20190295811
- Publication date Sep 26, 2019
- CARL ZEISS MICROSCOPY GMBH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR GENERATING A COMPOSITE IMAGE OF AN OBJECT AND PARTICLE B...
- Publication number 20170309443
- Publication date Oct 26, 2017
- CARL ZEISS MICROSCOPY GMBH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS