Lydia L. Hwang

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Midland, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for removing metal surface contaminants from silicon
- Patent number 5,851,303
- Issue date Dec 22, 1998
- Hemlock Semiconductor Corporation
- Lydia Lee-York Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method for particulate silicon
- Patent number 5,436,164
- Issue date Jul 25, 1995
- Hemlock Semi-Conductor Corporation
- Richard C. Dumler
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing irregular shaped chunked silicon for contaminates
- Patent number 5,361,128
- Issue date Nov 1, 1994
- Hemlock Semiconductor Corporation
- Michael Bourbina
- C30 - CRYSTAL GROWTH
Information Patent Grant
Trace metals analysis in semiconductor material
- Patent number 4,912,528
- Issue date Mar 27, 1990
- Hemlock Semiconductor Corporation
- Lydia L. Hwang
- C30 - CRYSTAL GROWTH