Lyle Shirley

Person

Boxboro, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for remote sensing of objects utilizing radiat...
- Patent number 8,761,494
- Issue date Jun 24, 2014
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for surface contour measurement
- Patent number 7,242,484
- Issue date Jul 10, 2007
- Massachusetts Institute of Technology
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for surface contour measurements
- Patent number 6,952,270
- Issue date Oct 4, 2005
- Massachusetts Institute of Technology
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for optically monitoring thickness
- Patent number 6,937,350
- Issue date Aug 30, 2005
- Massachusetts Institute of Technology
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for surface contour measurement
- Patent number 6,690,474
- Issue date Feb 10, 2004
- Massachusetts Institute of Technology
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Compensation for measurement uncertainty due to atmospheric effects
- Patent number 6,341,015
- Issue date Jan 22, 2002
- Massachusetts Institute of Technology
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Compensation for measurement uncertainty due to atmospheric effects
- Patent number 6,229,619
- Issue date May 8, 2001
- Massachusetts Institute of Technology
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for contour measurement using movable sources
- Patent number 6,031,612
- Issue date Feb 29, 2000
- Massachusetts Institute of Technology
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting relative displacement using a li...
- Patent number 5,900,936
- Issue date May 4, 1999
- Massachusetts Institute of Technology
- Lyle G. Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for surface contour measurement
- Patent number 5,870,191
- Issue date Feb 9, 1999
- Massachusetts Institute of Technology
- Lyle G. Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for remotely sensing the orientation of an ob...
- Patent number 5,811,826
- Issue date Sep 22, 1998
- Massachusetts Institute of Technology
- Lyle G. Shirley
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and methods for surface contour measurement
- Publication number 20060012802
- Publication date Jan 19, 2006
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for surface contour measurements
- Publication number 20040105100
- Publication date Jun 3, 2004
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for optically monitoring thickness
- Publication number 20030011789
- Publication date Jan 16, 2003
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Application
Compensation for measurement uncertainty due to atmospheric effects
- Publication number 20010009462
- Publication date Jul 26, 2001
- Lyle Shirley
- G01 - MEASURING TESTING

Lyle Shirley

Person

Patents Grantslast 30 patents

Method and apparatus for remote sensing of objects utilizing radiat...

Apparatus and methods for surface contour measurement

Apparatus and methods for surface contour measurements

Apparatus and methods for optically monitoring thickness

Apparatus and methods for surface contour measurement

Compensation for measurement uncertainty due to atmospheric effects

Compensation for measurement uncertainty due to atmospheric effects

Apparatus and methods for contour measurement using movable sources

Method and apparatus for detecting relative displacement using a li...

Apparatus and methods for surface contour measurement

Methods and apparatus for remotely sensing the orientation of an ob...

Patents Applicationslast 30 patents

Apparatus and methods for surface contour measurement

Apparatus and methods for surface contour measurements

Apparatus and methods for optically monitoring thickness

Compensation for measurement uncertainty due to atmospheric effects